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일반 | Local Electrode Atom Probes (LEAP) 발명자 세미나

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작성일03-02-06 15:33 조회11,902회

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나노분석장비로 새로이 개발된 LEAP의 발명자를 모시고 세미나를 아래와 같이 개최합니다.
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Local Electrode Atom Probes (LEAP)
- 3D Atomic-Scale Compositional Imaging -

2003. 2.14. 11:00-12:00
연구 2동 세미나실

Speaker
Dr. Thomas F. Kelly
Chairman, Founder and CTO of IMAGO
Inventor of LEAP
Formerly UW Madison, Tenured Full Professor, 17 years
Director Materials Science Center
Ph.D, MIT

Rush toward nano-technology calls for new innovative analytical
instrumentations, which surpass the capabilities of currently
available nano-scale microscopes, such as SEM, SIMS, TEM, AES, AFM,
STM, etc. Special demand is on 3D atomic-scale compositional image, in
other words, a computed axial tomographic (CAT) image of nano-scale
material. Do we have such a tool?
Recently, IMAGO invented LEAP, which pushes the limits. The technique
combines field emission atom probe and Mass Spectrometry (MS) to
produce an image. We will discuss the principles, advantages, and
applications of the technique. Advantage is “knowledge on 3D atomic-
scale compositional image within 1 hour”. Examples of application
will be shown, which include analyses of impurities in Cu, boron in
silicon, nano-scale giant magnetoresistive mutilayer, metal/dielectric
interface, nickel base super-alloy, etc.

* 관리자님에 의해서 게시물 복사되었습니다 (2005-10-25 16:31)