COMMODITY DESCRIPTION

(영문규격서)

관세분류번호 H.S.K NO.	품목번호 ITEM NO.	품목 및 규격서 DESCRIPTION	수량 Q'TY	단위 UNIT
9027.80.1000	4111172001	Scanning Electrochemical Microscope 82(전기화학적 주사현미경)	1	sys

A. Feature

1. Autosequencing of experiments, probe movement and area mapping.
2. Graphical Experiment Sequencing Engine (GESE).
3. Support for multi-zone scanning.
4. 3D area map analysis functions and dedicated 3D analysis areas.
5. Multiple data views for all experiments.
6. 2D Line Graph tools for analysing and overlaying data.
7. Full-screen correct-aspect-ratio display of area maps.
8. Mouse button definable for Edit point, Full Screen view, Move to point (X,Y), Cross Section,

2D Fourier.
9. User selectable American or European current convention support.
10. Selectable vibration frequency in SVP, SKP, CHM and CTM line and area scans

11. Available techniques (option)

- Scanning ElectroChemical Microscopy (SECM)

- Localized Electrochemical Impedance Spectroscopy (LEIS)

- Scanning Vibrating Electrode Technique (SVET/SVP)

- Scanning Droplet System (SDS)

- Scanning Kelvin Probe (SKP)

- Optical Surface Profiling (OSP)

- intermittent current – SECM (ic-SECM)

- alternative current – SECM (ac-SECM)

- alternative current – SDS (ac-SDS)

B. Configurations

1. dc,ac SECM Scanning Electrochemical Microscope

1) U-470B positioner

2) bi-potentiostat

3) MICROTRICELL Small Cell

4) Fused Silica

5) 15µm and 10µm probes

C. Specification

1. Scanning/Controller

1) Work station (all techniques)

- Scan range (x, y, z) : Greater than 100 mm

- Scan motor resolution : 9.76 nm

- Closed loop positioning : Linear zero

hysteresis encoder with direct real-time

readout of displacement in x, y and z

- Axis resolution (x, y, z) : 20 nm

- Max. scan speed : 10 mm/s

- Measurement resolution : 32-bit decoder @ up to 40 MHz

2) Piezo (ic- and ac-techniques)

- Vibration range : 20 nm - 2 μm peak to peak with 1 nm increments

- Min. vibration resolution : 0.12 nm calculated (16-bit DAC on 4 μm)

- Piezo crystal extension : 100 μm

- Positioning resolution : 0.09 nm calculated (20-bit DAC on 100 μm)

3) Mechanical and electrical

- Scan head : 500 x 420 x 675 mm (H x W x D)

- Scan control unit : 275 x 450 x 400 mm (H x W x D)

- Power : 250 W

2. bi-potentiostat

- Compliance Voltage : ±12 V

- Applied Potential : ±10 V

- Resolution : 4.7 nV

- Measured Potential : ±10 V

- Resolution : 1.2 µV

- Current Ranges : 1 nA to 1A

- Maximum Current : ± 500 mA

- Current Resolution : 23.8 fA

- Floating Capability Standard

- Cell Connections : 2, 3, or 4 electrode

- Scan Rate : 1 µV/s to 200 V/s

- Modes : Potentiostat, Galvanostat, OCP

- EIS Capability

Frequency Range 1 µHz to 1 MHz

Analyser Accuracy 0.1%, 1°

Frequency Resolution 66 nHz

- Available Experiments : Chronoamperometry, Chrono OCP, Chronopotentiometry,

Cyclic Voltammetry, Differential Pulse Voltammetry, Normal Pulse Voltammetry,

Linear Voltammetry, Square Wave Voltammetry, ECorr vs Time,

Galvanostatic Polarization, Linear Polarization Resistance, Potentiodynamic Polarization,

Potentiostatic Polarization, Tafel, Zero Resistance Ammetry,

Electrochemical Impedance Spectroscopy

3. MICROTRICELL Small Cell

4. Fused Silica

5. 15µm and 10µm probes

C. Remarks

1. One years warranty service after completion of on-site performance test should be provided.

2. Installation, operation, test-run and education on system operation should be carried  out two

times by at end-user's site.